A variety of inexpensive chip visible light sensor with a current output that is directly proportional towards the light level. They reveal excellent uniformity and linearity of performance with many types of light including tungsten filament, ambient, LED lights and fluorescent. The devices are supplied in SMD style (surface mounted device), especially designed to replace CdS cell as a result of the RoHS initiative.
Ambient light sensors (ALS) will also be known as illuminance or illumination sensors, photodetector, brightness sensors, photo transistor, optical sensors, or simply light sensors. One essential application for ALS technologies are mobile phones. Inside a mobile phone, the ALS enables automatic charge of display backlight brightness over an array of illumination conditions from the dark atmosphere to sunlight. This control significantly improves visibility and minimizes power consumption since LCD backlighting is able to take around 51% through the power within the input standby mode. Additionally, the ALS signal may be used to instruct the keypad LED driver to reduce keypad backlighting minimizing as much as 30% from the power within the input standby power mode.
Nowadays, designers convey more technology selections for ambient light sensors including photodiodes, photoelectric cells, phototransistors, and photo ICs. Each technologies have pros and cons. Among the key criteria for choosing an ALS is being able to identify the visible range of the human eye the 312nm to 1050nm wavelength is the 380nm - 780nm electromagnetic wave for visible light.
Chip phototransistors are silicon monolithic circuits with an integrated light-sensitive semiconductor photodiode — a PN junction which converts light into an electrical signal. The device have easily obtainable output current, small static current, fast response speed and stable performance. Suitable for all kinds of infrared light control, infrared radiation, infrared reflection, ultra-thin and multi-point infrared touch screen, high illumination or visible light interference strong products, and optical control infrared testing equipment.
Download complete specification Chip Phototransistor, RoHS Compliant (PT-A8-AC-1206-850) PDF.
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Part NO. | A (mm) | B (mm) | C (mm) | D (mm) | E (mm) | |||||
PT-A8-AC-1206-850 | 3.2 ± 0.2 | 2.0 ± 0.2 | 1.5 ± 0.2 | 1.1 ± 0.2 | 0.6 ± 0.2 |
Parameter | Symbol | Condition | Min. | Typ. | Max. | Unit |
Peak Wavelength | λp | \ | - | 850 | - | nm |
Spectral Response Bandwidth | λ | \ | 400 | - | 1100 | nm |
Collector-Emitter Breakdown Voltage | Bvceo | Ice=100µA Ee=0mW/cm2 |
30 | - | - | V |
Emitter-Base Breakdown Voltage | Bveco | Ice=100µA Ee=0mW/cm2 |
3 | - | - | V |
Collector-Emitter Saturation Voltage | Vce (sat) |
Ice=2mA Ee=1mW/cm2 |
- | - | 0.4 | V |
Photo Current | IL(1) | Vcc=5V Ev=10Lux |
0.5 | 0.8 | 1.2 | μA |
IL(2) | Vcc=5V Ev=30Lux |
1.5 | 2.4 | 3.6 | μA | |
IL(3) | Vcc=5V Ev=100Lux |
5 | 8 | 12 | μA | |
Collector Dark Current | Iceo | Vce=5V Ev=0Lux |
- | - | 0.1 | μA |
Rise Time | tr | Vcc=5V Ice=1mA RL=1000Ω |
15 | us | ||
Fall Time | tf | 15 |
Photo Current | Test conditions | A shift | B shift | C shift | D shift | X shift | Unit |
Vce=5V Ev=10Lux |
/ | / | / | / | 0.5 ~ 1.2 | μA |
Parameter | Symbol | Value | Unit |
Collector-Emitter Voltage | VCEO | 30 | V |
Emitter-Collector-Voltage | VECO | 3 | V |
Power Dissipation | PC | 70 | mW |
Operating Temperature Range | Topr | -25 ~ +85 | °C |
Storage Temperature | Tstg | -40 ~ +100 | °C |
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Mounting :
Soldering :
Lead-forming and cuttings :
Storage:
The sensor is incorporated in the transparent resin package. Because of its sensitivity to humidity, the package is moisture-proof. When storing the sensor, do as instructed below.
Cleaning:
PT | - | A8 | - | AC | - | 1206 | - | 850 | ||||||||||||||||||
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